Anúncios

Edição Atual

v. 17 n. 1 (2024): Publicação contínua - JAN-DEZ 2024
Publicado: 2024-01-28

Artigos

  • ARTIFICIAL INTELLIGENCE APPLIED TO QUALITY DEFECTS CLASSIFICATION FOR TYRES

    Alex da Silva Alves, Michael Sampaio dos Santos, Gedeane Kenshima
    DOI: https://doi.org/10.18624/etech.v17i1.1262
  • METAVERSE AND ITS COMMERCIAL APPLICATIONS: OPPORTUNITIES AND CHALLENGES FOR COMPANIES

    MATEUS ZILLE CHAVES, GUILHERME LERCH LUNARDI, ERROL FERNANDO ZEPKA PEREIRA JUNIOR, RICARDO SARAIVA FRIO
    DOI: https://doi.org/10.18624/etech.v17i1.1304
  • PRODUCTION OF SHEEP'S MILK POWDER BY SPRAY DRYING TECHNIQUE: PHYSICAL, MICROBIOLOGICAL AND SENSORY

    Creciana Maria Endres, Janaína, Rosi kischener, Fabiane Paula Werlang, Francieli Souza dos Santos, Claudiane Juriati, Karine Lena Meneghetti
    DOI: https://doi.org/10.18624/etech.v17i1.1308
  • COMPARING THE TOTAL COST OF OWNERSHIP OF ELECTRIC TRUCKS VS. DIESEL: A CASE STUDY INSPIRED BY AMBEV

    TAIZA CRISOSTIMO FERREIRA DE ANDRADE, LUCI LONGO
    DOI: https://doi.org/10.18624/etech.v17i1.1311
  • "LEARNING TO LEARN” IN PROFESSIONAL TEACHER EDUCATION

    Leandro Hupalo
    DOI: https://doi.org/10.18624/etech.v17i1.1314
  • KNOWLEDGE SHARING IN THE REVERSE SUPPLY CHAIN

    Jurema Suely de Araújo Nery Ribeiro, Renata de Souza França, Fabio Correa, Fabricio Ziviani
    DOI: https://doi.org/10.18624/etech.v17i1.1315
  • STUDY OF THE RELATIONCHIPS BETWEEN LEADERSHIP AND PSYCHOLOGICAL SAFETY: NA INTEGRATIVE REVIEW an integrative review

    Denise Wentz Forte, Karmel Cristina Nardi da Silva, Cristiano José Castro de Almeida Cunha, Solange Maria da Silva
    DOI: https://doi.org/10.18624/etech.v17i1.1317
  • TECHNOLOGICAL DISRUPTION AND ENTREPRENEURIAL BEHAVIOR

    Marcelo Duarte Minutti, Sonia Marise Salles Carvalho
    DOI: https://doi.org/10.18624/etech.v17i1.1318
  • THE ADOPTION OF THE CASE METHOD OF TEACHING IN VOCATIONAL EDUCATION

    Nahuan Alaff Virgino Soares, Caio Mauricio Guimaraes de Oliveira, Cleilson Antônio Luciano de Morais
    DOI: https://doi.org/10.18624/etech.v17i1.1332
Ver Todas as Edições